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Angelo P. Tanna, MD; Sanjay Asrani, MD; Ran Zeimer, PhD; Shazhou Zou, MS; Morton F. Goldberg, MD

Arch Ophthalmol. 1998;116:1036-1041.

Objective  To assess the morphologic characteristics of the foveal abnormality in juvenile X-linked retinoschisis using the scanning retinal thickness analyzer (RTA). This characteristic foveal abnormality is present in 83% to 100% of patients with X-linked retinoschisis and has not been demonstrated histopathologically.

Methods  The RTA is a noncontact imaging device. The RTA scans an obliquely oriented slit laser beam across the macula to obtain a series of optical cross sections, which are digitized.

Participants  The RTA was used to examine 7 eyes of 5 patients with X-linked retinoschisis.

Results  The RTA demonstrated foveal schisis in all eyes examined. In 2 eyes of 2 patients, a single schisis cavity, with an inner leaf in a dome-shaped configuration, was present. In 4 eyes of 3 patients, a single schisis cavity containing fine strands was present. Some of these strands partially, and others completely, bridged the cavity. In 1 eye of 1 patient, 2 separate schisis cavities with bridging strands were present in the fovea.

Conclusions  Scanning RTA is a noninvasive imaging modality capable of producing optical cross sections that demonstrate the extent and structural details of the foveal schisis in X-linked retinoschisis. Scanning RTA seems to be effective in the detection, characterization, and quantification of foveal schisis.

From The Johns Hopkins University School of Medicine and The Wilmer Ophthalmological Institute, Baltimore, Md. Dr Zeimer is entitled to sales royalty from Talia Technology Ltd, Mevaseret Zion, Israel, which is developing products related to the research described in this article. In addition, Dr Zeimer serves as a consultant to Talia Technology Ltd. The terms of this arrangement have been reviewed and approved by The Johns Hopkins University in accordance with its conflict of interest policies. The other authors have no proprietary interest in any material described in this article.

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